Showing results: 46 - 60 of 178 items found.
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52400 series -
Chroma ATE Inc.
Hybrid Compatible PXIFour quadrant operationHigh source/measurement resolution (multiple ranges)Low output noiseHigh programming/measurement speed (100k s/S) & slew rateOptional measurement logDIO bitsOutput profiling by hardware sequencerProgrammable output resistanceFloating & Guarding output16 Control Bandwidth SelectionMaster / Slave operationDriver with LabView/LabWindows & C/C# APISoftpanel GUI
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B1514A -
Keysight Technologies
The 50 s Pulse Medium Current SMU is an SMU designed for faster pulsed IV measurement. It enables a pulsed measurement down to 50 s pulse width, a 10 times or more narrow pulsed measurement than provided by a comparable conventional SMU. In addition, the instrument offers a wider range and versatility, up to 30 V / 1A, with voltage/current programmability. It is useful to characterize high to medium power devices on the new materials such as SiC and GaN, and organic devices, and the MCSMU expands your choices of pulsed IV measurement.
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M9602A -
Keysight Technologies
The Keysight M9602A is a PXIe SMU featuring best-in-their-class narrow pulse width as narrow as 10 μs. It enables dynamic/pulsed measurements with up to 15 MSa/s for broad emerging applications such as VCSEL optical devices.
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M9603A -
Keysight Technologies
The Keysight M9603A is a PXIe precision SMU featuring best-in-their-class narrow pulse width as narrow as 10 μs. It enables dynamic/pulsed measurements with up to 15 MSa/s for broad emerging applications such as VCSEL optical devices.
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B1511B -
Keysight Technologies
The SMUs of B1500A integrate 4-quadrant voltage/current source and measurement capabilities for accurate IV measurement with the range of 0.1 fA - 1 A / 0.5 µV - 200 V. It supports spot, sweep, pulse sampling and QS-CV measurements.
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M9111A -
Keysight Technologies
The M9111A is a 1-slot, 2-quadrant PXIe module that provides stable, glitch-free sourcing and sinking, and high accuracy measurements. It offers high-throughput and measurement quality for design validation and production test of RF power amplifiers. With industry-leading output stability under extreme, dynamic load conditions and unmatched transient performance to dramatically reduce voltage droop due to pulse loading, the M9111A SMU speeds test time. The high-speed M9111A can change its output voltage, stabilize that voltage, and accurately measure current from Amps down to micro-Amps all in less than 1 ms so that you can move on to the next test as quickly as possible.
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52403P -
Chroma ATE Inc.
Chroma's 52403P is a PXI Express Short Pulse SMU (Source/Measure Unit) designed for fast, precise and reliable sourcing and measurement of thermo-sensitive devices such as high-power laser diodes (LD). Integrating a high-speed pulser, a high precision SMU and a DAQ module into a single PXIe SMU, the 52403P can measure both the LIV and the low-level leakage current of a high-power LDs.
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781742-01 -
NI
The PXIe-4140 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4140 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
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NS-1 -
Applied Instruments, Inc.
The Model NS-1 is a handheld broadband white Gaussian noise source. It generates a wide, even, RF noise-signal. The NS-1 is popular for testing network components and aligning a building's coaxial cable network. The NS-1's noise-signal is also used to provide the RF source for measuring insertion loss of cable, splitters, taps and more.
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DVTest Inc.
AC modules for RF Test Enclosures eliminate conducted and radiated interference, while providing a source of AC power.
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DVTest Inc.
DC modules for RF Test Enclosures eliminate conducted and radiated interference, while providing a source of DC power.
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National Technical Systems
NTS conducts wireless RF regulatory testing as well as RF immunity testing under its EMC/EMI capabilities. Also, we are capable of RF data record/playback in our RFR series of systems designed to support RF testing in applications where the source signal is not readily available in the lab where units must be tested.
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ERAVANT
A measurement device that is inserted into the transmission line between an RF source—such as a signal generator, vector network analyzer, or transmitter—and a load.
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Narda Safety Test Solutions
Handheld RF direction finding signal analyzers are ideal for tracing accidental, illegal, or deliberate interference or potentially dangerous signal sources.